发明名称 Robust optimization to generate drop patterns in imprint lithography which are tolerant of variations in drop volume and drop placement
摘要 Imprint lithography may comprise generating a fluid map, generating a fluid drop pattern, and applying a fluid to a substrate according to the fluid drop pattern. The fluid drop pattern may be generated using a stochastic process such as a Monte Carlo or structured experiment over the expected range of process variability for drop locations and drop volumes. Thus, variability in drop placement, volume, or both may be compensated for, resulting in surface features being substantially filled with the fluid during imprint.
申请公布号 US8586126(B2) 申请公布日期 2013.11.19
申请号 US20090579553 申请日期 2009.10.15
申请人 SCHUMAKER PHILIP D.;MOLECULAR IMPRINTS, INC. 发明人 SCHUMAKER PHILIP D.
分类号 B05D5/00 主分类号 B05D5/00
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