发明名称 Leakage measurement systems
摘要 Described examples include leakage measurement systems and methods for measuring leakage current between a word line at a boosted voltage and a word line at a supply voltage. The boosted voltage may be generated by charge pump circuitry. Examples of leakage measurement systems described herein may be included in memory devices.
申请公布号 US8588007(B2) 申请公布日期 2013.11.19
申请号 US201113036409 申请日期 2011.02.28
申请人 YAMADA SHIGEKAZU;MICRON TECHNOLOGY, INC. 发明人 YAMADA SHIGEKAZU
分类号 G11C7/06 主分类号 G11C7/06
代理机构 代理人
主权项
地址