发明名称 |
Leakage measurement systems |
摘要 |
Described examples include leakage measurement systems and methods for measuring leakage current between a word line at a boosted voltage and a word line at a supply voltage. The boosted voltage may be generated by charge pump circuitry. Examples of leakage measurement systems described herein may be included in memory devices.
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申请公布号 |
US8588007(B2) |
申请公布日期 |
2013.11.19 |
申请号 |
US201113036409 |
申请日期 |
2011.02.28 |
申请人 |
YAMADA SHIGEKAZU;MICRON TECHNOLOGY, INC. |
发明人 |
YAMADA SHIGEKAZU |
分类号 |
G11C7/06 |
主分类号 |
G11C7/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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