发明名称 Semiconductor device
摘要 A semiconductor device includes: an electron-transit layer made of a semiconductor, the electron-transit layer having a first band gap; an electron-supply layer disposed on the electron-transit layer, the electron-supply layer being made of a semiconductor having a second band gap that is wider than the first band gap; a barrier-forming layer disposed on the electron-supply layer, the barrier-forming layer being made of a semiconductor having a third band gap that is narrower than the second band gap; an upper-channel layer disposed on the barrier-forming layer, the upper-channel layer being made of a semiconductor doped with an impurity; a side-surface of the barrier-forming layer and the upper-channel layer formed by partly removing the barrier-forming layer and the upper-channel layer; an insulating-film disposed on the side-surface; a gate-electrode disposed on the insulating-film; a source-electrode connected to the upper-channel layer; and a drain-electrode connected to the electron-supply layer or the electron-transit layer.
申请公布号 US8586994(B2) 申请公布日期 2013.11.19
申请号 US201213558510 申请日期 2012.07.26
申请人 JOSHIN KAZUKIYO;FUJITSU LIMITED 发明人 JOSHIN KAZUKIYO
分类号 H01L31/0256;H01L31/0328;H01L31/0336;H01L31/072;H01L31/109 主分类号 H01L31/0256
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