发明名称 Test point design for a high speed bus
摘要 A circuit board includes a pair of differential signal lines and a pair of test point pads, one test point pad coupled to one of the signal lines and another of the test point pads coupled to another of the signal lines. The two test point pads are staggered relative to each other and the two signal lines. The circuit board includes a plurality of conductive layers and a plurality of insulating layers. The conductive layers can be etched into conductive patterns, or traces, for connecting the electronic components, which are soldered to the circuit board. The conductive layers may be selectively connected together by vias. One or more of the conductive layers may be a metal plane for providing a ground plane and/or a power plane. To minimize or eliminate the capacitance generated between the test point pad and an underlying ground plane and/or power plane, portions of the ground plane and/or the portion of the power plane directly aligned with each test point pad are removed.
申请公布号 US8586873(B2) 申请公布日期 2013.11.19
申请号 US20100710622 申请日期 2010.02.23
申请人 WU LEON;FLEXTRONICS AP, LLC 发明人 WU LEON
分类号 H05K1/11 主分类号 H05K1/11
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