发明名称 Semiconductor memory device having a reading transistor with a back-gate electrode
摘要 A semiconductor device with a reduced area and capable of higher integration and larger storage capacity is provided. A multi-valued memory cell including a reading transistor which includes a back gate electrode and a writing transistor is used. Data is written by turning on the writing transistor so that a potential according to the data is supplied to a node where one of a source electrode and a drain electrode of the writing transistor and a gate electrode of the reading transistor are electrically connected to each other, and then turning off the writing transistor and holding a predetermined potential in the node. Data is read by supplying a reading control potential to a control signal line connected to one of a source electrode and a drain electrode of the reading transistor, and then detecting potential change of a reading signal line.
申请公布号 US8588000(B2) 申请公布日期 2013.11.19
申请号 US201113108636 申请日期 2011.05.16
申请人 KAMATA KOICHIRO;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 KAMATA KOICHIRO
分类号 G11C16/04 主分类号 G11C16/04
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