发明名称 THE METHOD OF PREDICTING SILICON CONTENT AND THE METHOD OF PREDICTING SILICON OXIDE CONTENT USING THE SAME
摘要 Disclosed are a method for predicting the content of silicon and a method for predicting the content of silicon oxide using the same to know the each content of the silicon and silicon oxide in a sample. The method for predicting the content of the silicon according to the present invention comprises: a step for measuring mass (A) after inserting the fixed amount of the sample into a crucible (a); a step for inserting the crucible containing the sample into an electric furnace, reacting the silicon and oxygen at 940-960 according to chemical formula 1 (Si + O_2→ SiO_2(S)), taking the crucible containing the reacted sample out of the electric furnace, and then measuring mass (B)(b); and a step for calculating the content of the silicon by comparing the mass (A) with the mass (B). [Reference numerals] (AA) Start;(BB) End;(S110) Heating;(S120) Measuring mass before reaction;(S130) Measuring mass after reaction;(S140) Comparing mass
申请公布号 KR101330955(B1) 申请公布日期 2013.11.18
申请号 KR20120043525 申请日期 2012.04.25
申请人 发明人
分类号 G01N5/02;G01N25/00;G01N33/38 主分类号 G01N5/02
代理机构 代理人
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