发明名称 Apparatus for determining thermal power emitted from heat source used in semiconductor field, has electrical device including windings which are in thermal contact with heat region and cooling region of heat-conducting device
摘要 <p>The apparatus (1) has a heat-conducting device (2) which absorbs the heat energy emitted by heat source. An electrical device (3) is provided with winding (20) which is in thermal contact with heat region (4) of heat-conducting device, and winding (21) which is in thermal contact with cooling region (5) of heat-conducting device. The windings are arranged in parallel, and are transverse to heat flow direction.</p>
申请公布号 DE102013007439(A1) 申请公布日期 2013.11.14
申请号 DE20131007439 申请日期 2013.04.30
申请人 ADAMIETZ, HUBERT 发明人 ADAMIETZ, HUBERT
分类号 G01R21/02;G01R19/03;G01R31/28 主分类号 G01R21/02
代理机构 代理人
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