发明名称 |
CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY |
摘要 |
<p>An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror.</p> |
申请公布号 |
WO2013170090(A1) |
申请公布日期 |
2013.11.14 |
申请号 |
WO2013US40432 |
申请日期 |
2013.05.09 |
申请人 |
CALIFORNIA INSTITUTE OF TECHNOLOGY |
发明人 |
ZEWAIL, AHMED H.;BASKIN, JOHN SPENCER |
分类号 |
G01N23/00 |
主分类号 |
G01N23/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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