发明名称 CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY
摘要 <p>An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror.</p>
申请公布号 WO2013170090(A1) 申请公布日期 2013.11.14
申请号 WO2013US40432 申请日期 2013.05.09
申请人 CALIFORNIA INSTITUTE OF TECHNOLOGY 发明人 ZEWAIL, AHMED H.;BASKIN, JOHN SPENCER
分类号 G01N23/00 主分类号 G01N23/00
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