发明名称 SEMICONDUCTOR DEVICE AND MEASUREMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device that allows improving production efficiency and facilitating the connection between an integrated circuit and a lead frame, and to provide a measurement apparatus.SOLUTION: A semiconductor device includes: an oscillator having a plurality of external terminals disposed apart with a predetermined distance along a first direction on one surface; an integrated circuit having a first region in which a plurality of first electrode pads are formed along one side on a rectangular surface and a second region in which a plurality of second electrode pads are formed so as to sandwich the first region; and a lead frame in which the oscillator and the integrated circuit are mounted so that the external terminals, the first electrode pads, and the second electrode pads are oriented to substantially the same direction, and the first direction and one side of the integrated circuit are substantially parallel, and having terminals therearound.
申请公布号 JP2013232551(A) 申请公布日期 2013.11.14
申请号 JP20120104181 申请日期 2012.04.27
申请人 LAPIS SEMICONDUCTOR CO LTD 发明人 SONE NORIHISA;YAMADA KAZUYA;TAKEI AKIHIRO;YOSHIDA YUICHI;TAKEMASA KENGO
分类号 H01L25/00;H01L21/60 主分类号 H01L25/00
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