| 摘要 |
A test device of a semiconductor device for testing a semiconductor device including a plurality of interface pads includes a plurality of coupling units, each configured to be coupled to a corresponding one of the plurality of interface pads, a channel configured to be coupled to the plurality of coupling units, a voltage generating unit configured to generate a test voltage applied to the channel, and a current measuring unit configured to measure a current that flows on the channel in response to the test voltage.
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