发明名称 SUBSTRATE FOR FLUORESCENCE MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To provide a substrate for fluorescence measurement having a surface enhancement ratio sufficient for a fluorescence analysis and having a strong structure.SOLUTION: A plurality of fine particles 2 are solid-phased on a substrate 1, and metal layers 3 are continuously formed on the substrate 1 so as to cover all the plurality of fine particles 2. Portions of the continuously formed metal layers 3 are formed with protrusions 4. The metal layers 3 are formed continuously from a surface of the substrate to surfaces of the fine particles, and the plurality of fine particles 2 are dielectric.
申请公布号 JP2013231639(A) 申请公布日期 2013.11.14
申请号 JP20120102994 申请日期 2012.04.27
申请人 TOYO UNIV 发明人 TAKEI HIROYUKI;KAWAKAMI TAKU
分类号 G01N33/543;G01N21/64;G01N33/553 主分类号 G01N33/543
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