发明名称 ATTITUDE CONTROL STRUCTURE AND PROJECTION TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an attitude control structure and a projection test device enabling to achieve size reduction of a projection test device and allowing a projection test with high reproducibility to be conducted at low cost while an attitude of a projected projectile is maintained.SOLUTION: An attitude control structure 31 for suppressing attitude change of a projected projectile 11 is provided with a guide rail 33 provided to surround a track X of the projectile 11 and forcing the track X while constraining the attitude of the projectile 11, and a support mechanism 35 for supporting the guide rail 33 movably in a dynamic radial direction so that an inner diameter of a part 34 surrounded by the guide rail 33 is variable. The support mechanism 35 is provided with a support frame 38 for bundling the guide rail 33, and a rod-like member 40 inserted in a telescopic manner toward the inside from the outside of the support frame 38, and having a front end 39 which is positioned inside of the support frame 38 and to which the guide rail 33 is attached.
申请公布号 JP2013231548(A) 申请公布日期 2013.11.14
申请号 JP20120103558 申请日期 2012.04.27
申请人 IHI CORP 发明人 SHIMAMURA KAZUO;FUKUSHIGE SHINYA;KITAGAWA JUNICHI
分类号 F41F7/00;F42B14/06;G01N3/313 主分类号 F41F7/00
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