发明名称 3D LOCALISATION MICROSCOPY AND 4D LOCALISATION MICROSCOPY AND TRACKING METHODS AND SYSTEMS
摘要 A 3D localisation microscopy system, 4D localisation microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of which image or of said light to or from the objective is related to another location independent property of the emitter.
申请公布号 US2013300833(A1) 申请公布日期 2013.11.14
申请号 US201113825794 申请日期 2011.09.26
申请人 SOELLER CHRISTIAN;BADDELEY DAVID MICHAEL;CANNELL MARK BRYDEN;CARL ZEISS MICROSCOPY GMBH 发明人 SOELLER CHRISTIAN;BADDELEY DAVID MICHAEL;CANNELL MARK BRYDEN
分类号 G02B21/36;G02B21/00 主分类号 G02B21/36
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