发明名称 INTEGRATED CIRCUIT AND METHOD FOR FABRICATING THE SAME HAVING A REPLACEMENT GATE STRUCTURE
摘要 Integrated circuits and methods of fabricating integrated circuits are provided herein. In an embodiment, a method of fabricating an integrated circuit includes depositing a layer of a high-k dielectric material; depositing a layer of a work function shifter material over a portion of the high-k dielectric material to form an overlapping region; heat treating the layer of the high-k dielectric material and the layer of the work function shifter material to as to form a transformed dielectric material via thermal diffusion that is a combination of the high-k dielectric and work function shifter materials in the overlapping region; and depositing a layer of a first replacement gate fill material to obtain multiple threshold voltages.
申请公布号 US2013299922(A1) 申请公布日期 2013.11.14
申请号 US201213467659 申请日期 2012.05.09
申请人 CHOI KISIK;KIM HOON;GLOBALFOUNDRIES INC. 发明人 CHOI KISIK;KIM HOON
分类号 H01L29/78;H01L21/28 主分类号 H01L29/78
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