发明名称 |
METHOD FOR FORMING WIRING, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
A wiring which is formed using a conductive film containing copper and whose shape is controlled is provided. A transistor including an electrode which is formed in the same layer as the wiring is provided. Further, a semiconductor device including the transistor and the wiring is provided. A resist mask is formed over a second conductive film stacked over a first conductive film; part of the second conductive film and part of the first conductive film are removed with use of the resist mask as a mask so that the first conductive film has a taper angle greater than or equal to 15° and less than or equal to 45°; and the resist mask is removed. The first conductive film contains copper.
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申请公布号 |
US2013302938(A1) |
申请公布日期 |
2013.11.14 |
申请号 |
US201313875563 |
申请日期 |
2013.05.02 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
SATO TAKAHIRO;CHO TAKAYUKI;KOSHIOKA SHUNSUKE;OHSHIMA TETSUYA;SAKAMOTO NAOYA |
分类号 |
H01L29/66;H05K3/06 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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