发明名称 METHOD FOR FORMING WIRING, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A wiring which is formed using a conductive film containing copper and whose shape is controlled is provided. A transistor including an electrode which is formed in the same layer as the wiring is provided. Further, a semiconductor device including the transistor and the wiring is provided. A resist mask is formed over a second conductive film stacked over a first conductive film; part of the second conductive film and part of the first conductive film are removed with use of the resist mask as a mask so that the first conductive film has a taper angle greater than or equal to 15° and less than or equal to 45°; and the resist mask is removed. The first conductive film contains copper.
申请公布号 US2013302938(A1) 申请公布日期 2013.11.14
申请号 US201313875563 申请日期 2013.05.02
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 SATO TAKAHIRO;CHO TAKAYUKI;KOSHIOKA SHUNSUKE;OHSHIMA TETSUYA;SAKAMOTO NAOYA
分类号 H01L29/66;H05K3/06 主分类号 H01L29/66
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