| 摘要 |
Provided are an insulation inspection method that enables accurate resistance measurement of insulation defect sections and a device therefor. The insulation inspection device is for a substrate having a plurality of wiring patterns formed thereon, and has: a selection means that selects one wiring pattern as a first measurement section and also selects, as a target measurement section, a wiring pattern having the first measurement section and an insulation defect; a power supply means that supplies prescribed electric signals between the first measurement section and the target measurement section; a measurement means that measures the electrical characteristics therebetween; and a calculation means that calculates the electrical characteristics of the first measurement section and the insulation defect section of the target measurement section, on the basis of the electric signals supplied by the power supply means and the measurement values measured by the measurement means. The selection means electrically connects one end of the first measurement section and one end of the power supply means, electrically connects the other end of the first measurement section and one end of the measurement means, electrically connects one end of the target measurement section and the other end of the power supply means, and electrically connects the other end of the target measurement section and one end of the measurement means. |
