发明名称 Through Wire Interconnect (TWI) For Semiconductor Components Having Wire In Via And Bonded Connection With Substrate Contact
摘要 A through wire interconnect for a semiconductor substrate includes a via extending through the semiconductor substrate from the first side to the second side thereof; a wire in the via having a first end with a bonded connection to the substrate contact and a second end proximate to the second side of the semiconductor substrate; a dielectric material in the via configured to electrically insulate the wire from the semiconductor substrate; a bonding member bonded to the first end of the wire and to the substrate contact configured to secure the wire to the substrate contact; and a contact on the second end of the wire.
申请公布号 US2013299983(A1) 申请公布日期 2013.11.14
申请号 US201313945392 申请日期 2013.07.18
申请人 MICRON TECHNOLOGY INC. 发明人 WOOD ALAN G.;HEMBREE DAVID R.
分类号 H01L23/00;H01L23/48 主分类号 H01L23/00
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