Optical identification feature

摘要

System comprises: at least one optical marking feature (10) comprising a number of nanostructures (14) on one surface; a light source (18) for emission of the detection light; a spatially resolving optical detector for detecting the light pattern of at least one optical marking feature; an evaluation unit. The nanostructures are constructed and arranged such that the light emitted by them in response to the illumination of detection light at the detector results in an interference pattern corresponding to the displayed pattern of light. System comprises: at least one optical marking feature (10) comprising a number of nanostructures (14) on one surface which are designed to constitute a pattern when illuminated by the detection light (20) for the identification and/or characterization of an object (17); a light source (18) for emission of the detection light; a spatially resolving optical detector for detecting the light pattern of at least one optical marking feature produced in response to the illumination with the light detection; an evaluation unit connected to the detector for the identification or characterization of the object from the detected light pattern. The nanostructures are constructed and arranged such that the light emitted by them in response to the illumination of detection light at the detector results in an interference pattern corresponding to the displayed pattern of light. An independent claim is also included for identifying or characterizing an object with a system, comprising irradiating at least one identification feature with detection light and detecting the light pattern which is generated in response to the identification feature.