发明名称 |
Method and apparatus for nondestructive measuring of a coating thickness on a curved surface |
摘要 |
An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.
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申请公布号 |
US8581602(B2) |
申请公布日期 |
2013.11.12 |
申请号 |
US20100851439 |
申请日期 |
2010.08.05 |
申请人 |
BRAY ALAN V.;LINDSEY MATTHEW;SYSTEMS AND MATERIALS RESEARCH CORPORATION |
发明人 |
BRAY ALAN V.;LINDSEY MATTHEW |
分类号 |
G01R27/04;G01R27/32 |
主分类号 |
G01R27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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