| 摘要 |
The present invention relates to a test socket for inspecting the electric property of an object. The test socket of the present invention includes an accommodation part formed in an inspection direction, a housing having an accommodation support part protruding from the inner wall of the accommodation part, a probe support body supporting a flexible probes and supported and separated from the housing in the accommodation part of the housing, and an object accommodation body laminated on the probe support body and accommodated in the accommodation part. According the test socket of the present invention, the probe support body is easily replaced and elastically vibrated in the inspection direction by stably floating the object accommodation body. |
