| 摘要 |
A point structure for RF calibration and testing of a PCB is provided. The point structure includes a test pad, an antenna connection pad, and a device mounting pad. The test pad is connected to a circuit unit of the PCB, and a ground pad is connected with a ground of the PCB. A contact probe apparatus for performing RF calibration and testing is connected to the test pad and the ground pad. The antenna connection pad is connected to an antenna unit. The device mounting pad is connected with the test pad and the antenna connection pad. An antenna device is mounted on the device mounting pad. The test pad, the ground pad, the antenna connection pad, and the device mounting pad are separated from one another. Since the point structure can replace an RF switch, a circuit area on the PCB may be reduced, a mounting space may be secured, and a manufacturing cost may be reduced.
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