发明名称 Manufacturing method of device
摘要 A device manufacturing method includes: sequentially forming a first sacrificial film, a first support film, a second sacrificial film, and a second support film on a semiconductor substrate; forming a hole to pass through these films; forming a crown-shaped electrode covering an inner surface of the hole and connected to the second support film and the first support film; forming a first opening in the second support film into a first pattern designed such that the connection between the crown-shaped electrode and the second support film is at least partially maintained; removing at least a part of the second sacrificial film through the first opening; forming a second opening in the first support film with use of the first opening; and removing the first sacrificial film through the second opening. This method is able to prevent misalignment of openings between the support films.
申请公布号 US8580681(B2) 申请公布日期 2013.11.12
申请号 US201213553916 申请日期 2012.07.20
申请人 SAKO NOBUYUKI;ELPIDA MEMORY, INC. 发明人 SAKO NOBUYUKI
分类号 H01L21/44 主分类号 H01L21/44
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