发明名称 Processing method for bump-included device wafer
摘要 A processing method for a bump-included device wafer which includes an adhesive providing step of providing an adhesive in an annular groove of a carrier wafer so that the adhesive projects from the upper surface of an annular projection of the carrier wafer; a wafer attaching step of attaching and fixing the front side of the device wafer through the adhesive to the front side of the carrier wafer so as to accommodate bumps in a recess of the carrier wafer after performing the adhesive providing step; and a thickness reducing step of grinding or polishing the back side of the device wafer to reduce the thickness of the device wafer to a predetermined thickness after performing the wafer attaching step.
申请公布号 US8580655(B2) 申请公布日期 2013.11.12
申请号 US201213410794 申请日期 2012.03.02
申请人 MARTIN DEVIN;BROWN MARK;DISCO CORPORATION 发明人 MARTIN DEVIN;BROWN MARK
分类号 H01L21/46 主分类号 H01L21/46
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