发明名称 Method for fabricating semiconductor device with buried gates
摘要 A method for fabricating a semiconductor device includes forming first plugs over a substrate, forming contact holes that expose the first plugs, ion-implanting an anti-diffusion material into the first plugs, and forming second plugs filling the contact holes.
申请公布号 US8580678(B2) 申请公布日期 2013.11.12
申请号 US201113242709 申请日期 2011.09.23
申请人 HWANG SUN-HWAN;HYNIX SEMICONDUCTOR INC. 发明人 HWANG SUN-HWAN
分类号 H01L21/4763;H01L21/336 主分类号 H01L21/4763
代理机构 代理人
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