发明名称 Method for manufacturing a stacked device conductive path connectivity
摘要 Various embodiments include apparatus and methods having circuitry to test continuity of conductive paths coupled to dice arranged in a stack. In at least one of these embodiments, a method includes electrically coupling each of the conductive paths to at least one of a first supply node and a second supply node. One of the conductive paths includes conductive material inside a via that can extend at least partly through a die among the dice in the stack. The method also includes receiving signals from the conductive paths, and determining continuity of the conductive paths based on the signals without using a boundary scan.
申请公布号 US8578591(B2) 申请公布日期 2013.11.12
申请号 US201113299158 申请日期 2011.11.17
申请人 HARGAN EBRAHIM H;MICRON TECHNOLOGY, INC. 发明人 HARGAN EBRAHIM H
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址