发明名称 Trench schottky diode and manufacturing method thereof
摘要 A trench Schottky diode and a manufacturing method thereof are provided. A plurality of trenches are formed in A semiconductor substrate. A plurality of doped regions are formed in the semiconductor substrate and under some of the trenches. A gate oxide layer is formed on a surface of the semiconductor substrate and the surfaces of the trenches. A polysilicon structure is formed on the gate oxide layer. Then, the polysilicon structure is etched, so that the gate oxide layer within the trenches is covered by the polysilicon structure. Then, a mask layer is formed to cover the polysilicon structure within a part of the trenches and a part of the gate oxide layer, and the semiconductor substrate uncovered by the mask layer is exposed. Afterwards, a metal sputtering layer is formed to cover a part of the surface of the semiconductor substrate.
申请公布号 US8581360(B2) 申请公布日期 2013.11.12
申请号 US201213396863 申请日期 2012.02.15
申请人 CHEN TZU-HSIUNG 发明人 CHEN TZU-HSIUNG
分类号 H01L21/329 主分类号 H01L21/329
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