发明名称 Solder interconnect by addition of copper
摘要 A method of forming an electronic device provides an electronic device substrate having a solder bump pad located thereover. A nickel-containing layer is located over the solder bump pad. A copper-containing layer is formed on the nickel-containing layer prior to subjecting the electronic device to a reflow process.
申请公布号 US8580621(B2) 申请公布日期 2013.11.12
申请号 US201313752524 申请日期 2013.01.29
申请人 LSI CORPORATION 发明人 BACHMAN MARK A.;OSENBACH JOHN W.;DESAI KISHOR V.
分类号 H01L21/00;H01L21/44 主分类号 H01L21/00
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