发明名称 METHOD FOR LATERALLY CUTTING THROUGH A SEMICONDUCTOR WAFER AND OPTOELECTRONIC COMPONENT
摘要 A method for laterally dividing a semiconductor wafer (1) comprises the method steps of: providing a growth substrate (2); epitaxially growing a semiconductor layer sequence (3), which comprises a functional semiconductor layer (5), onto the growth substrate (2); applying a mask layer (10) to partial regions of the semiconductor layer sequence (3) in order to produce masked regions (11) and unmasked regions (12); implanting ions through the unmasked regions (12) in order to produce implantation regions (13) in the semiconductor wafer (1); and dividing the semiconductor wafer (1) along the implantation regions (13), wherein the growth substrate (2) or at least one part of the growth substrate (2) is separated from the semiconductor wafer.
申请公布号 KR101325397(B1) 申请公布日期 2013.11.08
申请号 KR20087007758 申请日期 2006.08.07
申请人 发明人
分类号 H01L21/301;H01L33/00;H01L33/12;H01L33/16;H01L33/32;H01S5/323 主分类号 H01L21/301
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