| 摘要 |
PURPOSE: A probe card assembly using a flexible printed circuit board (f-PCB) is provided to maximize a contact area between a probe card pin and an electrode pad, thereby improving test performance. CONSTITUTION: A probe card pin consists of a probe card pin body (101) and a probe (100). The probe card pin is combined with a fixing block (106). The fixing block is combined with a block (108). The block is combined with a printed circuit board (110). An f-PCB (114) is connected to a second connector (116) formed on the probe card pin body and a first connector (112) formed on the printed circuit board. |
