| 摘要 |
A probe card is provided to prevent the disconnection of the connector and the connecting object by enlarging the space between the first substrate structure and the cap. The circuit pattern and connector are formed in the upper side of the first substrate structure(110). The connector is connected to the circuit pattern. A plurality of probes is formed in the lower surface of the second substrate structure(120). The second substrate structure is positioned in the lower surface of the first substrate structure. The connector and probes are electrically connected with a plurality of flexible connector(160). The upper gusset(130) is combined in the upper side of the first substrate structure. The cap of the gusset plate covers the opening in order not to contact the flexible connector. |
