发明名称 INSULATION RESISTANCE MEASURING APPARATUS AND INSULATION RESISTANCE MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To shorten time required for arriving at a state capable of notifying a measurement result based on an accurate insulation resistance value.SOLUTION: Measurement processing (step 16) is executed at a previously regulated time interval, first average value acquisition processing (step 19) for acquiring a first average value by performing average processing of Nb=20 insulation resistance values out of Na=20 insulation resistance values including a measured insulation resistance value by a moving-average method is executed in each processing, and first measurement result notification processing (step 20) for notifying a measurement result based on the first average value is executed. In each measurement processing, a measured insulation resistance value is compared with an insulation resistance value measured just before the measurement processing (step 18), and when a condition that the measured insulation resistance value is smaller than the insulation resistance value measured just before the measurement processing is satisfied by M=1 times, first average value acquisition processing (step 19) for determining the insulation resistance value measured just before the measurement processing as a first one out of Na=20 insulation resistance values is started.
申请公布号 JP2013228340(A) 申请公布日期 2013.11.07
申请号 JP20120101989 申请日期 2012.04.27
申请人 HIOKI EE CORP 发明人 NAKAZAWA MASAHIRO;TAKEUCHI HIDEKI;SAITO RYUTA
分类号 G01R27/02 主分类号 G01R27/02
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