发明名称 SEMICONDUCTOR PROCESS
摘要 A semiconductor process includes the following steps. A fin-shaped structure is formed on a substrate. A gate structure and a cap layer are formed, wherein the gate structure is disposed across parts of the fin-shaped structure and parts of the substrate, the cap layer is on the gate structure, and the cap layer includes a first cap layer on the gate structure and a second cap layer on the first cap layer. A spacer material is formed to entirely cover the second cap layer, the fin-shaped structure and the substrate. The spacer material is etched, so that the sidewalls of the second cap layer are exposed and a spacer is formed beside the gate structure. The second cap layer is removed.
申请公布号 US2013295738(A1) 申请公布日期 2013.11.07
申请号 US201213463809 申请日期 2012.05.03
申请人 KUO LUNG-EN;LIAO JIUNN-HSIUNG;CHEN HSUAN-HSU 发明人 KUO LUNG-EN;LIAO JIUNN-HSIUNG;CHEN HSUAN-HSU
分类号 H01L21/336 主分类号 H01L21/336
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