发明名称 Semiconductor device
摘要 <p>An object is to manufacture a semiconductor device including an oxide semiconductor at low cost with high productivity in such a manner that a photolithography process is simplified by reducing the number of light-exposure masks. In a method for manufacturing a semiconductor device including a channel-etched inverted-staggered thin film transistor, an oxide semiconductor film and a conductive film are etched using a mask layer formed with the use of a multi-tone mask which is a light-exposure mask through which light is transmitted so as to have a plurality of intensities. In etching steps, a first etching step is performed by dry etching in which an etching gas is used, and a second etching step is performed by wet etching in which an etchant is used.</p>
申请公布号 KR101325946(B1) 申请公布日期 2013.11.07
申请号 KR20120094593 申请日期 2012.08.29
申请人 发明人
分类号 G02F1/1368;H01L21/28;H01L21/3065;H01L21/336;H01L29/417;H01L29/786;H01L51/50 主分类号 G02F1/1368
代理机构 代理人
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