发明名称 CHARGED PARTICLE BEAM APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a charged particle beam apparatus in which image drift, or the like, occurring when mounting a sample on a stage can be suppressed effectively.SOLUTION: Based on a detection signal obtained by a charged particle beam apparatus, the travel of a measuring point is determined, and the temperature of a sample stage is controlled so that the travel becomes zero or reaches or goes below a predetermined value. More specifically, the temperature of a sample stage is controlled so that the movement is suppressed depending on the travel of the measuring point which moves as the time elapses.
申请公布号 JP2013229188(A) 申请公布日期 2013.11.07
申请号 JP20120100534 申请日期 2012.04.26
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 TANABE HARUHIKO;TSUNODA MASAHIRO;KOMURO OSAMU;SUGANO SEIICHIRO
分类号 H01J37/20;H01J37/22;H01L21/683 主分类号 H01J37/20
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