发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 In a method of manufacturing a semiconductor device, a source/drain feature is formed over a substrate. A Si-containing layer is formed over the source/drain feature. A metal layer is formed over the Si-containing layer. A metal silicide layer is formed from the metal layer and Si in the Si-containing layer.
申请公布号 US2013295739(A1) 申请公布日期 2013.11.07
申请号 US201213461532 申请日期 2012.05.01
申请人 HSIAO WEN CHU;CHONG LAI WAN;WANG CHUN-CHIEH;CHOU YING MIN;KO HSIANG HSIANG;WANG YING-LANG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HSIAO WEN CHU;CHONG LAI WAN;WANG CHUN-CHIEH;CHOU YING MIN;KO HSIANG HSIANG;WANG YING-LANG
分类号 H01L21/336 主分类号 H01L21/336
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