发明名称 |
HETEROJUNCTION FIELD-EFFECT TRANSISTOR, AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a heterojunction field-effect transistor and a method of manufacturing the same capable of improving a withstanding voltage and reducing on-resistance.SOLUTION: A cap layer 5 made of GaN is selectively formed on a barrier layer 4. That is, the cap layer 5 is formed only in a drain direction gate electrode vicinity region that extends from a position (a first position) adjacent on a drain electrode 8 side to an I-shaped part of a T shape of a gate electrode 10 to a position (a second position; a position separated from the drain electrode 8 by a predetermined distance) not reaching the drain electrode 8, in a direction toward the drain electrode 8 (and an Si injection region 6 under the drain electrode). |
申请公布号 |
JP2013229486(A) |
申请公布日期 |
2013.11.07 |
申请号 |
JP20120101292 |
申请日期 |
2012.04.26 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
IMAI AKIFUMI;NANJO TAKUMA;SUITA MUNEYOSHI;SUZUKI YOSUKE;OKAZAKI HIROYUKI;YAGYU EIJI;ABE YUJI |
分类号 |
H01L21/338;H01L21/28;H01L29/41;H01L29/423;H01L29/49;H01L29/778;H01L29/812 |
主分类号 |
H01L21/338 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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