发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 <p>An MOSFET (1) includes a silicon carbide substrate (10), an active layer (20), a gate oxide film (30), and a gate electrode (40). The active layer (20) includes a body region (22) where an inversion layer (29) is formed at a region in contact with the gate oxide film (30) by application of voltage to the gate electrode (40). The body region includes a low concentration region (22B) arranged at a region where an inversion layer (29) is formed, and containing impurities of low concentration, and a high concentration region (22A) adjacent to the low concentration region (22B) in the carrier mobile direction in the inversion layer (29), arranged in a region where the inversion layer (29) is formed, and containing impurities higher in concentration than in the low concentration region (22B).</p>
申请公布号 KR20130121668(A) 申请公布日期 2013.11.06
申请号 KR20127019707 申请日期 2011.10.25
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 MASUDA TAKEYOSHI;WADA KEIJI;HIYOSHI TORU
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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