| 摘要 |
A property measurement system for a metal material includes: a laser oscillator that emits a pulse laser beam; a lens array that has small lenses with a same shape, the small lenses being laid in a matrix on a plane perpendicular to an optical axis of the pulse laser beam, and arranged so that a part of a cross section of the pulse laser beam can be made incident onto each of small lenses; a condensing lens that overlaps and condenses emitted beams coming from the small lenses on a same region of a surface of a metal material as a measurement target; a laser interferometer that detects, as an electric signal, a pulse ultrasonic wave that is excited by the pulse laser beam condensed and propagates through an inside of the metal material; and a signal processing device that processes the electric signal. |
