发明名称 Charged-particle microscopy with image stitching
摘要 A method of producing a composite image of a sample using a charged-particle microscope, the composite image comprising a plurality of sub-images that are stitched together along overlap zones, said method comprising the following steps: - Mounting the sample on a sample holder; - Using a particle-optical column to direct at least one input beam of particulate radiation onto the sample, thereby producing an interaction that causes a plurality of different types of output radiation to emanate from the sample; - Detecting a first type of output radiation and using it to produce: –  A sub-image I 1A of a primary region R A of the sample; –  A sub-image I 1B of a secondary region R B of the sample, whereby R B is adjacent to R A and overlaps partially therewith, and I 1B has an overlap zone Z 1 with I 1A , which method comprises the following steps: - Detecting a second type of output radiation, different to said first type, and using it to produce: –  A sub-image I 2A of primary region R A ; –  A sub-image I 2B of secondary region R B , whereby I 2B has an overlap zone Z 2 with I 2A ; - Using computer processing apparatus to: –  Elect one of the sub-image pairs (I 1A , I 1B ) and (I 2A , I 2B ); –  For the sub-image pair thus elected, calculate the relative shift ” of its two sub-images that is required to bring them into mutual registration, and stitch the two sub-images together after effecting this shift ”; –  For the other of the sub-image pairs, stitch its two sub-images together on the basis of the same relative shift ”. In an aspect of this method, said computer processing apparatus is used to: - Examine correlation of I 1B to I 1A within zone Z 1 ; - Examine correlation of I 2B to I 2A within zone Z 2 ; - Use the outcome of these examinations in performing said election.
申请公布号 EP2660845(A1) 申请公布日期 2013.11.06
申请号 EP20120166368 申请日期 2012.05.02
申请人 FEI COMPANY 发明人 JANUS, MICHAEL;GESTMANN, INGO
分类号 H01J37/22;H01J37/28 主分类号 H01J37/22
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