发明名称 Mask blank, transfer mask, method of manufacturing a transfer mask, and method of manufacturing a semiconductor device
摘要 A mask blank for use in the manufacture of a transfer mask adapted to be applied with ArF excimer laser exposure light is disclosed. The mask blank has, on a transparent substrate, a light-shielding film for forming a transfer pattern. The light-shielding film has an at least two-layer structure including a lower layer and an upper layer from the transparent substrate side. The lower layer is made of a material composed of a transition metal, silicon, and nitrogen and having a nitrogen content of 21 at % or more and a refractive index n of 1.9 or less. The upper layer is made of a material composed of a transition metal, silicon, and nitrogen and having a refractive index n of 2.1 or less. A surface layer of the upper layer contains oxygen and has a nitrogen content of 14 at % or more.
申请公布号 US8574793(B2) 申请公布日期 2013.11.05
申请号 US201113327008 申请日期 2011.12.15
申请人 KOMINATO ATSUSHI;HASHIMOTO MASAHIRO;IWASHITA HIROYUKI;HOYA CORPORATION 发明人 KOMINATO ATSUSHI;HASHIMOTO MASAHIRO;IWASHITA HIROYUKI
分类号 G03F1/50 主分类号 G03F1/50
代理机构 代理人
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