发明名称 DEVICE AND METHODS FOR HIGH-K AND METAL GATE STACKS
摘要 <p>Described are a semiconductor device with five gate stacks on the different regions of a semiconductor substrate and a manufacturing method thereof. The semiconductor device includes a semiconductor substrate and a dividing feature to divide the semiconductor substrate into different regions. The different regions are a pFET core region, a pFET IO region, an nFET core region, an nFET IO region, and a high resistive region. [Reference numerals] (102) Provide a semiconductor substrate;(104) Form a dielectric layer;(106) Form an interface layer on the substrate and the dielectric layer;(108) Deposit a HK dielectric layer on the interface layer;(110) Deposit a first capping layer on the HK dielectric layer;(112) Deposit a second capping layer on the HK dielectric layer and the first capping layer;(114) Deposit a WF metal layer on the second capping layer and deposit a poly silicon layer on the WF metal layer;(116) Form a gate stack</p>
申请公布号 KR20130120964(A) 申请公布日期 2013.11.05
申请号 KR20120066816 申请日期 2012.06.21
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 WU WEI CHENG;CHEN PO NIEN;NG JIN AUN;YOUNG BAO RU;CHUANG HAK LAY
分类号 H01L27/092;H01L21/8238 主分类号 H01L27/092
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