发明名称 Semiconductor device and test method
摘要 A semiconductor device includes a first circuit block, a second circuit block, a first lead-out line coupled to the first circuit block, a second lead-out line coupled to the second circuit block, a first pad coupled to the first lead-out line, a second pad coupled to the second lead-out line, and a shielding line provided between the first lead-out line and the second lead-out line.
申请公布号 US8575952(B2) 申请公布日期 2013.11.05
申请号 US20100685035 申请日期 2010.01.11
申请人 KAWASAKI KENICHI;FUJITSU LIMITED 发明人 KAWASAKI KENICHI
分类号 G01R31/3187 主分类号 G01R31/3187
代理机构 代理人
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