发明名称 Carbosilane precursors for low temperature film deposition
摘要 Provided are processes for the low temperature deposition of silicon-containing films using carbosilane precursors containing a carbon atom bridging at least two silicon atoms. Certain methods comprise providing a substrate; in a PECVD process, exposing the substrate surface to a carbosilane precursor containing at least one carbon atom bridging at least two silicon atoms; exposing the carbosilane precursor to a low-powered energy sourcedirect plasma to provide a carbosilane at the substrate surface; and densifying the carbosilanestripping away at least some of the hydrogen atoms to provide a film comprising SiC. The SiC film may be exposed to the carbosilane surface to a nitrogen source to provide a film comprising SiCN.
申请公布号 US8575033(B2) 申请公布日期 2013.11.05
申请号 US201213609867 申请日期 2012.09.11
申请人 WELDMAN TIMOTHY W.;SCHROEDER TODD;APPLIED MATERIALS, INC. 发明人 WELDMAN TIMOTHY W.;SCHROEDER TODD
分类号 H01L21/302 主分类号 H01L21/302
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