发明名称 METHOD AND APPARATUS FOR SINGLE-PARTICLE LOCALIZATION USING WAVELET ANALYSIS
摘要 Accurate localization of isolated particles is important in single particle based super-resolution microscopy. It allows the imaging of biological samples with nanometer-scale resolution using a simple fluorescence microscopy setup. Nevertheless, conventional techniques for localizing single particles can take minutes to hours of computation time because they require up to a million localizations to form an image. In contrast, the present particle localization techniques use wavelet-based image decomposition and image segmentation to achieve nanometer-scale resolution in two dimensions within seconds to minutes. This two-dimensional localization can be augmented with localization in a third dimension based on a fit to the imaging system's point-spread function (PSF), which may be asymmetric along the optical axis. For an astigmatic imaging system, the PSF is an ellipse whose eccentricity and orientation varies along the optical axis. When implemented with a mix of CPU/GPU processing, the present techniques are fast enough to localize single particles while imaging (in real-time).
申请公布号 CA2802420(A1) 申请公布日期 2013.11.02
申请号 CA20132802420 申请日期 2013.01.16
申请人 CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE 发明人 SIBARITA, JEAN-BAPTISTE
分类号 G01N15/10;G02B21/00;G06T7/00 主分类号 G01N15/10
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