ELECTRICAL CONNECTING ASSEMBLY FOR PROBE CARD, PROBE CARD HAVING THE ELECTRICAL CONNECTING ASSEMBLY, MANUFACTURING METHOD OF ELECTRICAL CONNECTING ASSEMBLY FOR PROBE CARD AND MANUFACTURING METHOD OF HAVING THE ELECTRICAL CONNECTING ASSEMBLY

摘要

An electrical connecting assembly for a probe card and a manufacturing method thereof are provided to improve the electrical junction and the mechanical strength of bump by forming the bump by bonding the wire. An electricity connection assembly for the probe card includes the first concatenated terminal(11) which has a first width and is formed on the substrate(10) for being electrically connected to the probe tip; the second connection terminal(50) which has the different second width from the first width and is formed on the first concatenated terminal. The probe tip which electrically contacts the test material is arranged on the second connection terminal.