发明名称 APPARATUS FOR TESTING ELECTRONIC PARTS
摘要 PURPOSE: An electronic component testing device is provided to prevent the leakage of light generated in an electronic component by inserting a light emitting unit of the electronic component into an insertion unit of a socket member. CONSTITUTION: An electronic component testing device includes a returning unit (20) and a measuring unit (40). The returning unit includes a mounting member and a driving device which rotates the mounting member. The measuring unit measures a property of an electronic component returned by the returning unit. The measuring unit includes an integration sphere (41), a socket member (43), and a socket member moving device (46). The integration sphere has an opening that one side is opened. The socket member is installed inside the opening of the integration sphere and forms an insertion unit which the electronic component is inserted. The socket member moving device moves the socket member in order that the electronic component is inserted into the insertion unit of the socket member.
申请公布号 KR20130119092(A) 申请公布日期 2013.10.31
申请号 KR20120041982 申请日期 2012.04.23
申请人 QMC. INC. 发明人 KANG, DONG SEONG
分类号 G01R31/26;G01J1/02;G01M11/02 主分类号 G01R31/26
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