发明名称 ELECTRONIC APPARATUS, AND ABNORMALITY DETECTION METHOD OF ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To detect an abnormality of an operation of a control program of an electronic apparatus itself, and to appropriately acquire data for specifying a cause of the abnormality to make it easy to analyze the cause of the abnormality in the electronic apparatus.SOLUTION: The electronic apparatus includes processing time measurement means, measurement data accumulation means, abnormality detection means, behavior data acquisition means and behavior data accumulation means. When processing time measured by the processing time measurement means and accumulated by the measurement data accumulation means deviates from a reference by a fixed threshold, the abnormality detection means determines the processing time as an abnormality. The behavior data acquisition means stops acquisition of behavior data when the abnormality is detected by the abnormality detection means, and when the abnormality is detected by the abnormality detection means, the behavior data for a fixed period until immediately before detection of the abnormality is accumulated in the behavior data accumulation means.
申请公布号 JP2013225189(A) 申请公布日期 2013.10.31
申请号 JP20120096389 申请日期 2012.04.20
申请人 HITACHI APPLIANCES INC 发明人 NISHIDA TOSHIO;OKAMOTO CHIKAYUKI
分类号 G06F11/30;G06F11/34 主分类号 G06F11/30
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