发明名称 LASER AND PLASMA ETCH WAFER DICING USING UV-CURABLE ADHESIVE FILM
摘要 <p>Laser and plasma etch wafer dicing using UV-curable adhesive films is described. In an example, a method includes forming a mask above the semiconductor wafer. The semiconductor wafer is coupled to a carrier substrate by a UV-curable adhesive film. The mask covers and protects the integrated circuits. The mask is patterned with a laser scribing process to provide a patterned mask with gaps. The patterning exposes regions of the semiconductor wafer between the integrated circuits. The semiconductor wafer is then etched through the gaps in the patterned mask to form singulated integrated circuits. The UV-curable adhesive film is then irradiated with ultra-violet (UV) light. The singulated integrated circuits are then detached from the carrier substrate.</p>
申请公布号 WO2013162936(A1) 申请公布日期 2013.10.31
申请号 WO2013US36657 申请日期 2013.04.15
申请人 APPLIED MATERIALS, INC. 发明人 LEI, WEI-SHENG;CHOWDHURY, MOHAMMAD K.;EGAN, TODD;EATON, BRAD;YALAMANCHILI, MADHAVA RAO;KUMAR, AJAY
分类号 H01L21/301;B23K26/00 主分类号 H01L21/301
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