发明名称 RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, AND POLYMERIC COMPOUND
摘要 PROBLEM TO BE SOLVED: To provide a resist composition capable of reducing a diffusion distance of an acid generated by exposure.SOLUTION: The resist composition comprises a base component (A) that generates an acid by exposure and shows changes in the solubility with a developing solution by an action of an acid. The base component (A) includes a structural unit (a0) expressed by (a0-1), a structural unit (a1) containing an acid decomposable group that increases polarity by an action of an acid, and a structural unit (a6) generating an acid by exposure. In the formula, Rrepresents a hydrogen atom, an alkyl group having Cto C, or a halogenated alkyl group having Cto C; W represents one of -COO-, -CONH- and a divalent aromatic hydrocarbon group; Yand Yrepresent a divalent linking group or a single bond; and Rrepresents a cyclic group having -SO-.
申请公布号 JP2013225126(A) 申请公布日期 2013.10.31
申请号 JP20130060999 申请日期 2013.03.22
申请人 TOKYO OHKA KOGYO CO LTD 发明人 DAZAI NAOHIRO;UTSUMI YOSHIYUKI;IWASHITA ATSUSHI;MATSUZAWA KENSUKE;KONNO TAKEMASA
分类号 G03F7/039;C08F220/38;G03F7/004 主分类号 G03F7/039
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