| 摘要 |
A method includes, in a nonvolatile memory device that includes a plurality of dies, detecting that a first temperature associated with a first die is equal to or exceeds a temperature threshold. A metablock is defined to include a first plurality of storage blocks that includes a first storage block of the first die. Each storage block of the metablock resides in a distinct die of the plurality of dies. The method also includes, in response to detecting that the first temperature is equal to or exceeds the temperature threshold, redefining the metablock to exclude from the redefined metablock any storage block associated with the first die. |
